XPS, static SIMS and NEXAFS spectroscopic investigation of thiol adsorption on metals and metal sulfidesGOH, S. W; BUCKLEY, A. N; LAMB, R. N et al.Proceedings - Electrochemical Society. 2006, pp 107-119, issn 0161-6374, isbn 1-56677-440-3, 1Vol, 13 p.Conference Paper

Fe and N self-diffusion in amorphous FeN : A SIMS and neutron reflectivity studyCHAKRAVARTY, S; GUPTA, M; GUPTA, A et al.Acta materialia. 2009, Vol 57, Num 4, pp 1263-1271, issn 1359-6454, 9 p.Article

The use of the ¹⁸O₂-exposure + SIMS-based approach to investigate the spallation mechanisms of alumina scalesJEDLINSKI, J.Materials and corrosion (1995). 2006, Vol 57, Num 2, pp 185-191, issn 0947-5117, 7 p.Article

Composition and distribution profile of uncontrolled impurities in molybdenum analyzed by the Auger electron spectroscopy and secondary ion mass spectrometry methodsALIEV, A. A; KODIROV, T.Journal of communications technology & electronics. 2002, Vol 47, Num 4, pp 433-439, issn 1064-2269Article

Analysis of zirconium-nobium pressure tube surface for hydrogen using secondary ion mass spectrometry (SIMS)MCINTYRE, N. S; WEISENER, C. G; DAVIDSON, R. D et al.Surface and interface analysis. 1990, Vol 15, Num 10, pp 591-597, issn 0142-2421Article

The detection of oxygen in magneto-optical layers with SIMS = Détection de l'oxygène dans les couches magnéto-optiques par SIMSTOLLE, H. J; HEITMANN, H.Mikrochimica acta (1966. Print). 1987, Vol 1, Num 1-6, pp 379-385, issn 0026-3672Conference Paper

rf-plasma oxidation process of Pb alloy performed using oxygen isotope observed by secondary ion mass spectroscopic analysis = Processus d'oxydation par plasma haute fréquence d'un alliage de plomb en utilisant un isotope de l'oxygène observé par analyse par spectrométrie de masse d'ions secondairesWADA, M; NAKANO, J; OSHIMA, M et al.Journal of applied physics. 1985, Vol 58, Num 8, pp 3195-3199, issn 0021-8979Article

SIMS analysis of the impurity diffusion of In in Cu = Analyse SIMS de la diffusion d'impureté de In dans CuGUST, W; OSTERTAG, C; PREDEL, B et al.Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties. 1983, Vol 47, Num 3, pp 395-406, issn 0141-8610Article

Werkstoffcharakterisierung mittels SIMS: Neue Moeglichkeiten der Spuren-, Mikrobereichs- und Oberflaechenanalayse = Caractérisation des matériaux par SIMS; nouvelles possibilités de l'analyse des traces, de la microanalyse, et de l'analyse de surface = Characterization of materials by SIMS: new possibilities of trace, micro and surface analysisGRASSERBAUER, M; STINGEDER, G; PIMMINGER, M et al.Fresenius' Zeitschrift für analytische Chemie. 1983, Vol 315, Num 7, pp 575-590, issn 0016-1152Article

Investigation of the mechanism of plasma electrolytic oxidation of aluminium using ¹⁸0 tracerMATYKINA, E; ARRABAL, R; SCURR, D. J et al.Corrosion science. 2010, Vol 52, Num 3, pp 1070-1076, issn 0010-938X, 7 p.Article

Investigation of the anodically formed passive film on iron by secondary ion mass spectroscopy = Etude des couches de passivation formées anodiquement sur du fer par spectrométrie SIMSMURPHY, O. J; POU, T. E; BOCKRIS, J. O et al.Journal of the Electrochemical Society. 1984, Vol 131, Num 12, pp 2785-2790, issn 0013-4651Article

Etude de l'oxydation du Cu-Be: caractéristiques de la couche oxydée en fonction des conditions de traitement = Study of oxidation of Cu-Be: characteristics of oxidated film with processing conditionsFARRAYRE, A; JUPILLE, J; PIQUARD, G et al.1983, 106 p.Report

Mass analysis for metal and plastics by a FAB-SIMS/SNMS apparatus = Analyse des métaux et des plastiques par un appareil FAB-SIMS/SNMSNAGAI, K.Review of the electrical communication laboratories. 1988, Vol 36, Num 6, pp 587-592, issn 0029-067XArticle

The effect of the phase composition on secondary ion emission = L'effet de la composition de phase sur l'émission ionique secondaireSTULIK, D.Radiation effects. 1985, Vol 87, Num 3, pp 117-122, issn 0033-7579Article

Ge and Au profiles in GaAs produced from AuGe contacts and studied by SIMS = Untersuchung der von AuGe-Kontakten produzierten Ge- und Au-Profile in GaAs mittels SIMSNEBAUER, E; TRAPP, M.Physica status solidi. A. Applied research. 1984, Vol 84, Num 1, pp K39-K42, issn 0031-8965Article

New insights into the surface chemistry of aluminium and its oxides with static TOF-SIMS and scanning probe microscopiesMETSON, J. B; DUNLOP, H. M.International symposium on aluminium surface science and technology. 2000, pp 127-132Conference Paper

Inverse velocities of sputtered monatomic ions: Systematics and quantificationLODDING, A. R; VAN DER HEIDE, P. A. W; BROWN, J. D et al.Mikrochimica acta (1966. Print). 1997, Vol 125, Num 1-4, pp 317-323, issn 0026-3672Conference Paper

Quantitative analysis of oxide films on ODS-alloys using MCs⁺-SIMS and e-beam SNMSPFEIFER, J.-P; HOLZBRECHER, H; QUADAKKERS, W. J et al.Fresenius' journal of analytical chemistry. 1993, Vol 346, Num 1-3, pp 186-191, issn 0937-0633Conference Paper

Dotierungsanalyse an Halbleitern mit der Sekundaerionen-Massenspektrometrie = Analyse du dopage sur des semi-conducteurs avec la spectrométrie de masse à émission ionique secondaire = Semiconductor dopand analysis by secondary ion mass spectrometryMAUL, J.L; FRENZEL, H.TM. Technisches Messen. 1987, Vol 54, Num 9, pp 337-342, issn 0171-8096Article

Silicon migration during MBE growth of doped (Al, Ga)As films = Wanderung von Silizium waehrend MBE-Wachstum von dotierten duennen Schichten aus (Al, Ga)AsGONZALEZ, L; CLEGG, J.B; HILTON, D et al.Applied physics. A, Solids and surfaces. 1986, Vol 41, Num 3, pp 237-241, issn 0721-7250Article

Factors controlling the time evolution of the corrosion potential of aluminum in alkaline solutionsADHIKARI, Saikat; HEBERT, Kurt R.Corrosion science. 2008, Vol 50, Num 5, pp 1414-1421, issn 0010-938X, 8 p.Article

Surface study of water influence on chemical corrosion of Roman glassDAL BIANCO, B; BERTONCELLO, R; MILANESE, L et al.Surface engineering. 2005, Vol 21, Num 5-6, pp 393-396, issn 0267-0844, 4 p.Conference Paper

Influence de l'oxygène sur la déshydrogénation de l'alliage de titane AT3 au cours du recuit sous videVYKHODETS, V. B; GOLUBKOV, I. K; KLOTSMAN, S. M et al.Fizika metallov i metallovedenie. 1989, Vol 67, Num 6, pp 1128-1133, issn 0015-3230Article

Quantitative SIMS analysis of hydroxyl ion content in thin oxide films = Analyse quantitative par spectrométrie d'ion secondaire de la teneur en ions hydroxyle dans des films d'oxyde mincesMITCHELL, D. F; GRAHAM, M. J.Journal of the Electrochemical Society. 1986, Vol 133, Num 5, pp 936-938, issn 0013-4651Article

Analyse des dépôts par Auger et SIMS pour détermination des profils de concentration = Analysis of deposited layers by Auger electron spectroscopy and secondary ion mass spectrometry for determination of concentration profilesSIMONDET, F; DE RUGY, H.Le Vide, les couches minces. 1986, Num 232, pp 121-131, issn 0223-4335Conference Paper